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Test Procedures
Electrical Test Circuits
Competitor Part Cross
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Typical Qualification Tests for Crystal Oscillators
| TEST TYPE |
TEST METHOD |
TEST CONDITION |
| Electrical Characteristics |
Internal Specification |
Per Specification |
| Frequency vs. Temperature |
Internal Specification |
Per Specification |
| Mechanical Shock |
MIL-STD-202, Method 213 |
100 g's |
| Vibration |
MIL-STD-883, Method 2007, A |
20 g's Peak to Peak from 10 - 2000 Hz sweep |
| Thermal Cycle |
MIL-STD-883, Method 1011, B |
-55°C to +125°C, 15 Min Dwell, 10 Cycles |
| Aging |
Internal Specification |
168 Hours at 105°C |
| Gross Leak |
MIL-STD-202, Method 112, D |
30 Second Immersion, No Bubble Stream |
| Fine Leak |
MIL-STD-202, Method 112, C |
Must Meet 2x10-8 atm-cm3/sec Max. |
| Solderability |
MIL-STD-883, Method 2003 |
8 Hour Steam Age, Must Exhibit 95% Coverage |
| Resistance to Solvents |
MIL-STD-883, Method 2015 |
Three 1 Minute Soaks |
| Terminal Pull |
MIL-STD-883, Method 2004, A |
2 Pounds |
| Lead Bend |
MIL-STD-883, Method 2004, B1 |
1 bending Cycles |
| Physical Dimension |
Internal Specification |
Per Specification |
| Internal Visual |
Internal Specification |
Per Internal Specification |
| Soldering Conditions |
Pin Thru Packages
Surface Mount Devices |
260ºC, for 10s, Max.
260ºC, for 10s, Max. or 230ºC, for 90s, Max. |
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